Title:
WIDE BEAM EMISSION METHOD AND EMISSION SYSTEM FOR ULTRASONIC IMAGING
Document Type and Number:
WIPO Patent Application WO/2020/164299
Kind Code:
A1
Abstract:
Disclosed is a wide beam emission method for ultrasonic imaging, comprising: configuring sequentially, from a position on an emission line (20), a plurality of focal points (30) at equal intervals along a depth direction; and using the emission line (20) as a midpoint, disposing respective probe unit sets, with each probe unit set having two probe units (10) symmetrically disposed relative to the midpoint, such that the respective probe unit sets successively focus on respective focal points (30) according to the order of arrangement thereof; wherein a probe unit set closest to the emission line (20) used as a midpoint correspondingly has a focal point (30) of the shallowest depth, and a probe unit set farthest from the emission line (20) used as a midpoint correspondingly has a focal point (30) of the deepest depth. The wide beam emission method and emission system for ultrasonic imaging can realize wide beam emissions, and successively focus the same on respective focal points in a depth direction by means of respective symmetrical probe units, such that beam width and energy uniformity in the depth direction are better, and thus obtaining an ultrasonic image with better near-, mid-, and far-field gray scale and resolution consistency.
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Inventors:
LING TAO (CN)
SUN FENG (CN)
SUN FENG (CN)
Application Number:
PCT/CN2019/123867
Publication Date:
August 20, 2020
Filing Date:
December 09, 2019
Export Citation:
Assignee:
VINNO TECH (SUZHOU) CO LTD (CN)
International Classes:
A61B8/00
Foreign References:
| CN101770028A | 2010-07-07 | |||
| CN109674491A | 2019-04-26 | |||
| CN102809610A | 2012-12-05 | |||
| CN104434218A | 2015-03-25 | |||
| US20040068186A1 | 2004-04-08 | |||
| US5922962A | 1999-07-13 |
Attorney, Agent or Firm:
ADVANCE CHINA IP LAW OFFICE (CN)
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