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Patent Searching and Data


Title:
READ/WRITE WINDOW CALIBRATION CIRCUIT AND METHOD, MEMORY, AND FPGA CHIP
Document Type and Number:
WIPO Patent Application WO/2022/141798
Kind Code:
A1
Abstract:
The embodiments of the present application relate to the technical field of integrated circuits. Provided are a read/write window calibration circuit and method, a memory and an FPGA chip. A read window and a write window can be automatically adjusted, such that in cases where the working frequency of the read/write window calibration circuit satisfies a preset frequency, read data can pass through the read window, and write data can pass through the write window. The read/write window calibration circuit comprises: a calibration verification circuit which verifies, within a current clock period, whether read data and write data can pass through a write window and a read window; a read/write control timing generation circuit which increases the read window when the read data cannot pass through the read window, and increases the write window when the write data cannot pass through the write window; and a calibration verification circuit which acquires the working frequency of the read/write window calibration circuit, and when the working frequency is less than a preset frequency, controls the read/write control timing generation circuit to decrease the read window and/or the write window, and repeatedly verifies, within a next clock period, whether the read data can pass through the read window and whether the write data can pass through the write window.

Inventors:
PAN CHAO (CN)
ZHANG YONG (CN)
WEN CHANGQING (CN)
Application Number:
PCT/CN2021/079686
Publication Date:
July 07, 2022
Filing Date:
March 09, 2021
Export Citation:
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Assignee:
SHENZHEN PANGO MICROSYSTEMS CO LTD (CN)
International Classes:
G11C7/22
Foreign References:
CN110428856A2019-11-08
CN110097902A2019-08-06
US10734983B12020-08-04
US20180322939A12018-11-08
Attorney, Agent or Firm:
SHENZHEN ZHIQUAN INTELLECTUAL PROPERTY OFFICE (CN)
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