Title:
WORK ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/188417
Kind Code:
A1
Abstract:
This invention automatically adjusts and derives an assessment criterion (parameter) for accurately assessing work. This work analysis device comprises: a work labelling unit that assigns, to video data including work of a worker, a work label indicating the work of the worker; an object detection annotation unit that, with respect to the video data to which the work label was assigned, annotates an object related to the work of the worker; an object detection learning unit that generates an object detection model that performs object detection from video data of an object annotated by the object detection annotation unit; an object detection unit that uses the object detection model to detect an object from video data; a work assessment parameter calculation unit that assesses work in video data to which a work label was assigned, and calculates an assessment criterion which minimizes the error as compared to the assigned work label; and a work assessment unit that uses the object detection model and the assessment criterion to assess work of a worker in newly input video data.
Inventors:
UWANO TOMOFUMI (JP)
YAMATO KAZUHIRO (JP)
YAMATO KAZUHIRO (JP)
Application Number:
PCT/JP2022/016971
Publication Date:
October 05, 2023
Filing Date:
March 31, 2022
Export Citation:
Assignee:
FANUC CORP (JP)
International Classes:
G06T7/00; G05B19/418; G06Q50/04
Domestic Patent References:
| WO2021186592A1 | 2021-09-23 | |||
| WO2021059572A1 | 2021-04-01 | |||
| WO2020101036A1 | 2020-05-22 |
Foreign References:
| JP2020135417A | 2020-08-31 | |||
| JP2021157548A | 2021-10-07 |
Attorney, Agent or Firm:
SHOBAYASHI Masayuki et al. (JP)
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