Title:
X-RAY ANALYSIS APPARATUS
Document Type and Number:
WIPO Patent Application WO/2022/003850
Kind Code:
A1
Abstract:
An X-ray analysis apparatus comprising: a sample container (10) for accommodating a sample (S); a mounting part (24) on which the sample container (10) can be mounted; an X-ray radiation source for irradiating the sample (S) with X-rays from below the mounting part (24); a detector for detecting, below the mounting part, fluorescence X-rays generated from the sample (S); and a holder (50) for accommodating the sample container (10), the holder (50) being mounted on the mounting part (24). An opening (24h) is provided in the mounting part (24). The sample container (10) has: a container body (12), which surrounds the sample (S) and has a shape that is open downward; and a container film (14) for blocking the opening in the container body (12) and supporting the sample (S). The holder (50) has: a surrounding cylinder (52), which surrounds the sample container (10), has an outline larger than the opening (24h), and has a shape that is open downward; and a holder film (54) for blocking the opening in the surrounding cylinder (52).
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Inventors:
MORIHISA YUJI (JP)
TANTRAKARN KRIENGKAMOL (JP)
KOBAYASHI KANJI (JP)
SUZUKI KEIJIRO (JP)
TANTRAKARN KRIENGKAMOL (JP)
KOBAYASHI KANJI (JP)
SUZUKI KEIJIRO (JP)
Application Number:
PCT/JP2020/025763
Publication Date:
January 06, 2022
Filing Date:
July 01, 2020
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N23/223
Domestic Patent References:
| WO2004088296A1 | 2004-10-14 |
Foreign References:
| JP2011013027A | 2011-01-20 | |||
| JP2011089794A | 2011-05-06 | |||
| JP2006317153A | 2006-11-24 | |||
| JPH04355355A | 1992-12-09 | |||
| JPH04331349A | 1992-11-19 | |||
| US5703927A | 1997-12-30 | |||
| JP2018063196A | 2018-04-19 |
Other References:
See also references of EP 4177600A4
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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