X-RAY AUTOMATIC EVALUATION DEVICE, X-RAY AUTOMATIC EVALUATION METHOD

Title:

X-RAY AUTOMATIC EVALUATION DEVICE, X-RAY AUTOMATIC EVALUATION METHOD

Document Type and Number:

WIPO Patent Application WO/2018/003160

Kind Code:

A1

Abstract:

The purpose of the present invention is to improve examination efficiency when evaluating an object using X-rays by automatically evaluating an object that can be reliably determined to be safe. This X-ray automatic evaluation device evaluates whether an object is safe, on the basis of whether the area, of a portion of a pixel region of an X-ray image where the X-ray transmission amount is less than a transmission amount threshold and where the material is continuous, exceeds an area threshold.

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Inventors:

AKIRA NAOTO (JP)
NUKAGA NOBUO (JP)
MATSUBARA DAISUKE (JP)
YONEJI KENICHI (JP)

Application Number:

PCT/JP2017/004892

Publication Date:

January 04, 2018

Filing Date:

February 10, 2017

Export Citation:

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Assignee:

HITACHI LTD (JP)

International Classes:

G01N23/10

Foreign References:

JP2003279503A	2003-10-02
JP2006084275A	2006-03-30
JP2009122043A	2009-06-04
JP2002535625A	2002-10-22

Attorney, Agent or Firm:

HIRAKI Yusuke et al. (JP)

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