Title:
X-RAY CT SCANNER EVALUATION TOOL
Document Type and Number:
WIPO Patent Application WO/2022/014132
Kind Code:
A1
Abstract:
An X-ray CT scanner evaluation tool, according to the present invention, can be rendered in a first state having an outer shape in which at least two adjacent side surfaces are flat surfaces, and a second state having a columnar shape, and said X-ray CT scanner evaluation tool includes a plurality of balls on the inside thereof. Moreover, in the first state, the plurality of balls are optically observable, without overlapping with one another, from each of the two side surfaces, and in the second state, the plurality of balls are disposed such that, when rotated about the long axis of a column, any X-ray emitted to the column from an X-ray source at a prescribed position passes through the column without passing through two or more balls, at any angle of rotation.
Inventors:
TAKATSUJI TOSHIYUKI (JP)
WATANABE MARI (JP)
TELADA SOUICHI (JP)
WATANABE TSUKASA (JP)
WATANABE MARI (JP)
TELADA SOUICHI (JP)
WATANABE TSUKASA (JP)
Application Number:
PCT/JP2021/018077
Publication Date:
January 20, 2022
Filing Date:
May 12, 2021
Export Citation:
Assignee:
AIST (JP)
International Classes:
G01N23/046
Domestic Patent References:
| WO2018193800A1 | 2018-10-25 |
Foreign References:
| JP2016538552A | 2016-12-08 | |||
| US20050094771A1 | 2005-05-05 | |||
| JP2018179983A | 2018-11-15 |
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