Title:
X-RAY DETECTOR, X-RAY IMAGING DEVICE USING SAME, AND DRIVING METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2015/084068
Kind Code:
A1
Abstract:
The objective of the present invention is to effectively improve an image delay phenomenon of a direct conversion detector. The present invention provides an X-ray detector comprising: a lower electrode, formed on a substrate, to which a first driving voltage (V1) is applied; an auxiliary electrode, around the lower electrode, to which a second driving voltage (V2) is applied; a photoconductive layer formed on the lower electrode and the auxiliary electrode; and an upper electrode, formed on the photoconductive layer, to which a third driving voltage (V3) is applied, wherein the third driving voltage (V3), immediately following X-ray irradiation switch-off, is a reverse bias voltage.
Inventors:
LEE DONG JIN (KR)
KIM TAE WOO (KR)
IM SEONG IL (KR)
JEON PYO JIN (KR)
KIM TAE WOO (KR)
IM SEONG IL (KR)
JEON PYO JIN (KR)
Application Number:
PCT/KR2014/011816
Publication Date:
June 11, 2015
Filing Date:
December 04, 2014
Export Citation:
Assignee:
RAYENCE CO LTD (KR)
VATECH EWOO HOLDINGS CO LTD (KR)
UNIV YONSEI IACF (KR)
VATECH EWOO HOLDINGS CO LTD (KR)
UNIV YONSEI IACF (KR)
International Classes:
H01L31/115
Domestic Patent References:
| WO2007122890A1 | 2007-11-01 |
Foreign References:
| JPH1056196A | 1998-02-24 | |||
| JP2004134543A | 2004-04-30 | |||
| US6423974B1 | 2002-07-23 | |||
| JP2002151669A | 2002-05-24 |
Other References:
See also references of EP 3079174A4
None
None
Attorney, Agent or Firm:
NEIT INTERNATIONAL PATENT AND LAW FIRM (KR)
특허법인네이트 (KR)
특허법인네이트 (KR)
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