Title:
X-RAY DETECTOR
Document Type and Number:
WIPO Patent Application WO/2017/043871
Kind Code:
A1
Abstract:
The present invention relates to an X-ray detector using a direct conversion method, the X-ray detector comprising: a first electrode on a substrate; a semiconductor structure which is disposed on the first electrode and comprises a photoelectric material using a perovskite material; and a second electrode on the semiconductor structure.
Inventors:
HEO SUNG KYN (KR)
SHIN DONG HUI (KR)
KIM TAE WOO (KR)
YUN MIN SEOK (KR)
SHIN DONG HUI (KR)
KIM TAE WOO (KR)
YUN MIN SEOK (KR)
Application Number:
PCT/KR2016/010041
Publication Date:
March 16, 2017
Filing Date:
September 07, 2016
Export Citation:
Assignee:
RAYENCE CO LTD (KR)
VATECH EWOO HOLDINGS CO LTD (KR)
VATECH EWOO HOLDINGS CO LTD (KR)
International Classes:
G01T1/24; A61B6/14; C09J133/14; C09K3/10; C09K11/56; C09K11/66; C09K11/88; G01T1/02; H01L31/08
Domestic Patent References:
| WO2015116297A2 | 2015-08-06 |
Foreign References:
| US20050161604A1 | 2005-07-28 | |||
| KR20150056851A | 2015-05-27 | |||
| KR101366122B1 | 2014-02-25 | |||
| KR101546500B1 | 2015-08-24 |
Attorney, Agent or Firm:
NEIT INTERNATIONAL PATENT & LAW FIRM (KR)
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