X-RAY DEVICE, DATA PROCESSING DEVICE, AND DATA PROCESSING METHOD

Title:

X-RAY DEVICE, DATA PROCESSING DEVICE, AND DATA PROCESSING METHOD

Document Type and Number:

WIPO Patent Application WO/2017/069286

Kind Code:

A1

Abstract:

The present invention removes or reduces, from measurement values detected by a photon-counting detector, the amount of impact caused by physical phenomena such as beam hardening, etc., on X-ray attenuation, for each energy BIN. Characteristics of an X-ray attenuation amount μt defined by a plurality of known thicknesses t and a relevant ray attenuation coefficient μ are obtained for each X-ray energy BIN on the basis of measurement values of the photon-counting detector (24), said plurality of known thicknesses t each being different and being in the X-ray transmission direction of a substance. This substance constitutes a target object for imaging, etc., and comprises a raw material that is either the same substance (same type of substance) as the target object or resembles the target object in relation to effective atomic number. Correction data is calculated for replacing these X-ray attenuation amount μt characteristics with linear target characteristics passing through the origin of two-dimensional coordinates having thickness t on the horizontal axis and X-ray attenuation amount μt on the vertical axis. This correction data is calculated for each X-ray energy BIN.

Inventors:

YAMAKAWA TSUTOMU (JP)
YAMAMOTO SHUICHIRO (JP)
OKADA MASAHIRO (JP)

Application Number:

PCT/JP2016/081483

Publication Date:

April 27, 2017

Filing Date:

October 24, 2016

Export Citation:

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Assignee:

JOB CORP (JP)

International Classes:

G01N23/04; A61B6/00; G01N23/18

Domestic Patent References:

WO2010061810A1

2010-06-03

Foreign References:

JP2006101926A	2006-04-20
JP2002291729A	2002-10-08
JP2015184119A	2015-10-22
JPS6040941A	1985-03-04
JPH0327046A	1991-02-05
JP2008220653A	2008-09-25
JP2010082031A	2010-04-15

Other References: