X-RAY DIAGNOSTIC DEVICE

WIPO Patent Application WO/2012/096266

A1

An X-ray diagnostic device is provided with: an X-ray generation unit (1) which generates X-rays to be irradiated on a subject (P); an X-ray detection unit (2) which comprises a detector (21) for detecting the X-rays transmitted through the subject (P), and which generates X-ray transmission information; an image generation unit (7) which generates an X-ray image on the basis of the X-ray transmission information; and a lifespan sensor unit (11) which senses the lifespan of the detector on the basis of output values in the X-ray image. The lifespan sensor unit (11) is provided with: a brightness level value calculation unit (11b) which calculates the X-ray dose irradiated on the detector (21) on the basis of output values from areas of interest set on the X-ray image or the detector; a dose integration unit (11c) which adds the X-ray dose calculated by the brightness level value calculation unit (11b) to previous X-ray doses for each area of interest, and calculates the integral doses in the areas of interest; and a lifespan assessment unit (11d) which carries out a lifespan assessment for the detector (21) on the basis of the integral doses.

MATSUZAKI TAKEO (JP)
GOTO YASUNORI (JP)
OCHIAI RIE (JP)

PCT/JP2012/050293

July 19, 2012

January 10, 2012

Click for automatic bibliography generation  

TOSHIBA KK (JP)
TOSHIBA MEDICAL SYS CORP (JP)
MATSUZAKI TAKEO (JP)
GOTO YASUNORI (JP)
OCHIAI RIE (JP)

A61B6/00; G01T1/20; G03B42/02; G03B42/04

JP2009034484A	2009-02-19
JP2006084259A	2006-03-30
JP2007121010A	2007-05-17
JP2007020925A	2007-02-01
JP2002148211A	2002-05-22
JP2010082426A	2010-04-15
JP2005308600A	2005-11-04
JPH08266532A	1996-10-15

Ogawa Shinichi et al. (JP)
Shin-ichi Ogawa (JP)

View/Download PDF      PDF Help

Previous Patent: HEAT SOURCE SYSTEM, CONTROL METHOD THERFOR, AND PROGRAM THEREFOR

Next Patent: OXIDE SINTERED COMPACT AND SPUTTERING TARGET