X-RAY DIFFRACTION METHOD AND PORTABLE X-RAY DIFFRACTION APPARATUS USING SAME

WIPO Patent Application WO/2012/014982

A1

Disclosed is a portable x-ray diffraction measurement apparatus that can be held by human strength and can confirm an image of a measurement location. For this purpose, a portable x-ray diffraction apparatus comprises: an x-ray irradiation means for irradiating parallel x-rays onto a sample from an oblique direction; a diffraction x-ray detection means for concentrating and thereby detecting parallel-component diffraction x-rays from among x-rays diffracted by the sample onto which x-rays were irradiated by the x-ray irradiation means; and a signal processing means for processing a signal output from the diffraction x-ray detection means which has detected diffracted x-rays. In an x-ray diffraction method, parallel x-rays having continuous wavelengths are irradiated onto a sample, parallel components are extracted from diffraction x-rays diffracted by the sample onto which the x-rays were irradiated and the parallel components of the extracted diffraction x-rays are concentrated, the concentrated diffraction x-rays are detected by means of an energy dispersion-type detection element, and a signal detected and obtained by means of the detection element is processed.

NAKANO Asao (Matsubara-cho Akishima-sh, Tokyo 66, 〒1968666, JP)
中野　朝雄 (〒66 東京都昭島市松原町３丁目９番１２号　株式会社リガク内 Tokyo, 〒1968666, JP)

JP2011/067278

February 02, 2012

July 28, 2011

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RIGAKU CORPORATION (3-9-12, Matsubara-cho Akishima-sh, Tokyo 66, 〒1968666, JP)
株式会社リガク (〒66 東京都昭島市松原町３丁目９番１２号　 Tokyo, 〒1968666, JP)
NAKANO Asao (Matsubara-cho Akishima-sh, Tokyo 66, 〒1968666, JP)

G01N23/207

POLAIRE I.P.C. (7-1 Hatchobori 2-chome, Chuo-ku, Tokyo 32, 〒1040032, JP)

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