Title:
X-RAY EXAMINATION APPARATUS COMPRISING A FILTER
Document Type and Number:
WIPO Patent Application WO1999038172
Kind Code:
A3
Abstract:
An X-ray examination apparatus (1), including an X-ray source (2) and an X-ray detector (5), is provided with an X-ray filter (6) which is arranged between the X-ray source and the X-ray detector. The X-ray filter (6) includes a plurality of filter elements (7) whose X-ray absorptivity can be adjusted by adjustment of a quantity of X-ray absorbing liquid (14) within the individual filter elements; a first end of individual filter elements communicates with the X-ray absorbing liquid whereas a second end communicates with an X-ray transparent liquid (12). The X-ray filter is preferably provided with a pressure control system for independent control of the liquid pressure in individual row ducts (11) and individual column ducts (13). Individual filter elements are preferably provided with a piston for separating the X-ray absorbing liquid from the X-ray transparent liquid.
Inventors:
SCHILLER CHRISTOPH
DE SAMBER MARK A
FOKKINK LAMBERTUS G J
DE SAMBER MARK A
FOKKINK LAMBERTUS G J
Application Number:
PCT/IB1999/000053
Publication Date:
September 30, 1999
Filing Date:
January 18, 1999
Export Citation:
Assignee:
KONINKL PHILIPS ELECTRONICS NV (NL)
PHILIPS SVENSKA AB (SE)
PHILIPS SVENSKA AB (SE)
International Classes:
G21K1/10; G21K3/00; (IPC1-7): G21K3/00
Domestic Patent References:
| WO1997038629A1 | 1997-10-23 |
Foreign References:
| FR2599886A1 | 1987-12-11 |
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