Title:
X-RAY FLUORESCENCE ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/100611
Kind Code:
A1
Abstract:
This X-ray fluorescence analysis device comprises a calculation means (10) for calculating the content of an element in a sample (13) by an FP method, and, in order to take into account the effect of non-measured elements for which X-ray fluorescence is not measured, the calculation means (10) uses primary scattered X-rays on a short-wavelength side having a wavelength of 0.05-0.075 nm and primary scattered X-rays on a long-wavelength side having a wavelength of 0.11-0.23 nm as scattered rays for measuring intensity by a detection means (9), and assumes an average atomic number in the case of elements other than hydrogen among non-measured elements, and assumes the content of hydrogen in the case of hydrogen.
Inventors:
KATAOKA YOSHIYUKI (JP)
TANAKA SHIN (JP)
KUSAKABE YASUSHI (JP)
TANAKA SHIN (JP)
KUSAKABE YASUSHI (JP)
Application Number:
PCT/JP2022/041747
Publication Date:
June 08, 2023
Filing Date:
November 09, 2022
Export Citation:
Assignee:
RIGAKU DENKI CO LTD (JP)
International Classes:
G01N23/223
Domestic Patent References:
| WO2011027613A1 | 2011-03-10 |
Foreign References:
| JP2006343112A | 2006-12-21 | |||
| JP2006071311A | 2006-03-16 | |||
| JP2010223908A | 2010-10-07 |
Attorney, Agent or Firm:
SUGIMOTO, Shuji et al. (JP)
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