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Patent Searching and Data


Title:
X-RAY IMAGING APPARATUS
Document Type and Number:
WIPO Patent Application WO/2016/163177
Kind Code:
A1
Abstract:
An X-ray imaging apparatus 1 according to Example 1 comprises an X-ray detector 5 having a configuration wherein scintillator elements are defined by a lattice-like light shielding wall. A portion of X-rays incident on the X-ray detector 5 is incident on the light shielding wall and passes through the X-ray detector 5 without being converted to scintillator light. Therefore, since the X-ray detector 5 that receives X-rays has the scintillator elements defined by the lattice-like light shielding wall, arbitrarily defined, more limited regions of the X-ray detector 5 are allowed to receive X-rays 3a that have passed through a subject M similarly to when X-rays pass through a detection mask. Thus a detection mask from the X-ray imaging apparatus 1 which is used in the EI-XPCi method can be dispensed with, allowing manufacturing costs of the X-ray imaging apparatus 1 to be reduced.

Inventors:
TANABE KOICHI (JP)
FURUI SHINGO (JP)
YOSHIMUTA TOSHINORI (JP)
KIMURA KENJI (JP)
NISHIMURA AKIHIRO (JP)
SHIRAI TARO (JP)
DOKI TAKAHIRO (JP)
SANO SATOSHI (JP)
HORIBA AKIRA (JP)
SATO TOSHIYUKI (JP)
Application Number:
PCT/JP2016/056298
Publication Date:
October 13, 2016
Filing Date:
March 01, 2016
Export Citation:
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Assignee:
SHIMADZU CORP (JP)
International Classes:
A61B6/00
Foreign References:
JP2013164339A2013-08-22
JP2012228371A2012-11-22
Attorney, Agent or Firm:
SUGITANI Tsutomu (JP)
Tsutomu Sugitani (JP)
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