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Patent Searching and Data


Title:
X-RAY IMAGING DEVICE AND X-RAY IMAGING METHOD
Document Type and Number:
WIPO Patent Application WO/2014/041675
Kind Code:
A1
Abstract:
Polychromatic X-rays (13) emitted from an X-ray source (1) are incident to a plurality of crystal plates (2, 4), and X-rays with the required energy for measurement are selectively extracted by way of reflection of X-ray diffraction. Then, a specimen (18) is irradiated with the extracted X-rays for each energy at the same time and images are acquired. Thus, substances with equal linear absorption coefficients but different densities can be observed and specific elements can be made visible.

Inventors:
YONEYAMA AKIO (JP)
BABA RIKA (JP)
UEDA KAZUHIRO (JP)
Application Number:
PCT/JP2012/073570
Publication Date:
March 20, 2014
Filing Date:
September 14, 2012
Export Citation:
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Assignee:
HITACHI LTD (JP)
YONEYAMA AKIO (JP)
BABA RIKA (JP)
UEDA KAZUHIRO (JP)
International Classes:
G01N23/04
Foreign References:
JPH05340893A1993-12-24
JP2005181083A2005-07-07
JPH05340894A1993-12-24
JP2010266368A2010-11-25
JPS61167848A1986-07-29
JP2008086760A2008-04-17
JP2007195888A2007-08-09
JPH06308295A1994-11-04
JPH05346500A1993-12-27
JPH02224744A1990-09-06
JPH02205760A1990-08-15
JPS61167846A1986-07-29
Attorney, Agent or Firm:
INOUE Manabu et al. (JP)
Manabu Inoue (JP)
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