Title:
X-RAY INSPECTION APPARATUS
Document Type and Number:
WIPO Patent Application WO/2017/159856
Kind Code:
A1
Abstract:
The present invention addresses the problem of providing an X-ray inspection apparatus that, even if there is a variation in packaging material thickness among lots, is able to certainly carry out inspection for a missing part without being influenced by the variation. In the X-ray inspection apparatus (10), the brightness of a reagent region (Rn) is a value obtained after X-rays transmit through a content and a packaging material therefor. The brightness is smaller than that before the transmission by the amount of X-rays having been absorbed by the packaging material. Thus, as a result of correction of the amount, the brightness of the reagent region (Rn), from which the influence of the packaging material has been removed, is obtained. Consequently, the apparatus can prevent an erroneous determination in the inspection for a missing part, from being caused by thickness variation among packaging materials.
Inventors:
HIROSE OSAMU (JP)
Application Number:
PCT/JP2017/010933
Publication Date:
September 21, 2017
Filing Date:
March 17, 2017
Export Citation:
Assignee:
ISHIDA SEISAKUSHO (JP)
International Classes:
G01N23/04; G01N23/10; G01N23/18
Domestic Patent References:
| WO2015041259A1 | 2015-03-26 |
Foreign References:
| JP2015083967A | 2015-04-30 | |||
| JP2006126149A | 2006-05-18 |
Attorney, Agent or Firm:
SHINJYU GLOBAL IP (JP)
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