Title:
X-RAY INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2013/105149
Kind Code:
A1
Abstract:
Provided is an x-ray inspection device, comprising: a pair of conveyor frames (71, 72) which are positioned symmetrically about an axis of a central line (120a) along a substrate conveyance direction, and which clamp a printed substrate (W) in a substrate width direction; substrate conveyance mechanisms which convey in the x-axis direction the printed substrate (W) which is supported by each of the conveyor frames (71, 72); and gap adjustment mechanisms (90) which, by driving each of the conveyor frames (71, 72) to converge with or diverge from one another in the y-axis direction, adjust the width dimension of the printed substrate (W) which the substrate conveyance mechanism which is disposed in each of the conveyor frames (71, 72) is capable of conveying.
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Inventors:
OOKAWA NAONOBU (JP)
Application Number:
PCT/JP2012/004174
Publication Date:
July 18, 2013
Filing Date:
June 27, 2012
Export Citation:
Assignee:
YAMAHA MOTOR CO LTD (JP)
OOKAWA NAONOBU (JP)
OOKAWA NAONOBU (JP)
International Classes:
G01N23/04; H05K3/34
Foreign References:
| JP2008066630A | 2008-03-21 | |||
| JPH0715176A | 1995-01-17 | |||
| JPS62151268A | 1987-07-06 | |||
| JP2004028845A | 2004-01-29 | |||
| JP2003315288A | 2003-11-06 | |||
| JP2002189002A | 2002-07-05 |
Other References:
See also references of EP 2803981A4
Attorney, Agent or Firm:
KOTANI, Etsuji et al. (JP)
Etsuji Kotani (JP)
Etsuji Kotani (JP)
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Claims: