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Patent Searching and Data


Title:
X-RAY INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2016/132907
Kind Code:
A1
Abstract:
An X-ray inspection device (1) is provided with an X-ray source (11) for irradiating X-rays onto a product, an X-ray detection unit (13) for detecting X-rays having passed through the product, and a UPS (15) for supplying power when there is a power outage. The UPS (15) is not electrically connected to the X-ray source (11).

Inventors:
IWAI ATSUSHI (JP)
HARADA HIKARI (JP)
YURUGI FUTOSHI (JP)
KABUMOTO TAKASHI (JP)
Application Number:
PCT/JP2016/053239
Publication Date:
August 25, 2016
Filing Date:
February 03, 2016
Export Citation:
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Assignee:
ISHIDA SEISAKUSHO (JP)
International Classes:
G01N23/04; G01N23/18
Foreign References:
JP2002372505A2002-12-26
JP2004020297A2004-01-22
JP2009005451A2009-01-08
JP3449555B22003-09-22
Other References:
See also references of EP 3260848A4
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
Yoshiki Hasegawa (JP)
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