Title:
X-RAY INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/034170
Kind Code:
A1
Abstract:
An x-ray inspection device comprising: an x-ray irradiation unit that irradiates x-rays on an object; an x-ray detection unit that detects x-rays that have been transmitted through the object; an inspection unit that generates an x-ray transmission image of the object on the basis of a signal output from the x-ray detection unit and inspects the object on the basis of the x-ray transmission image; and a control unit that controls the x-ray irradiation unit and the x-ray detection unit. The control unit executes a first control that controls the x-ray irradiation unit so as to increase irradiation output when the detection output of the x-ray detection unit has decreased, if controlling the x-ray irradiation unit such that the irradiation output of the x-ray irradiation unit reaches a first irradiation output.
More Like This:
Inventors:
SUGIMOTO KAZUYUKI (JP)
SUHARA KAZUHIRO (JP)
SUHARA KAZUHIRO (JP)
Application Number:
PCT/JP2017/028304
Publication Date:
February 22, 2018
Filing Date:
August 03, 2017
Export Citation:
Assignee:
ISHIDA SEISAKUSHO (JP)
International Classes:
G01N23/18; G01N23/04
Foreign References:
| JPH10185841A | 1998-07-14 | |||
| JP2013160569A | 2013-08-19 | |||
| JP2011209177A | 2011-10-20 | |||
| JP2012198074A | 2012-10-18 | |||
| JP2004020442A | 2004-01-22 |
Other References:
See also references of EP 3502673A4
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
Download PDF:
Previous Patent: DIALOGUE CONTROL DEVICE AND METHOD
Next Patent: IMAGE PROCESSING DEVICE AND IMAGE PROCESSING METHOD
Next Patent: IMAGE PROCESSING DEVICE AND IMAGE PROCESSING METHOD