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Patent Searching and Data


Title:
X-RAY INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/207831
Kind Code:
A1
Abstract:
An X-ray inspection device (10) comprises: an X-ray generation device (20) for emitting X-rays; a sample placement portion (30) provided in a direction in which the X-rays are emitted with respect to the X-ray generation device; and a curved X-ray detector (40) provided on a side opposite to the X-ray generation device with respect to the sample placement portion so as to be rotatably movable about a rotation axis. The X-ray generation device may emit the X-rays radially about the rotation axis. The sample placement portion has a principal surface on which a sample (31) is placed, and the X-ray detector may be curved so as to approach the principal surface as the X-ray detector moves away from the X-ray generation device in a direction parallel to the principal surface.

Inventors:
ADACHI Masaya (3-7-1 Nishi-shinbashi Minato-k, Tokyo 03, 〒1050003, JP)
Application Number:
JP2018/044527
Publication Date:
October 31, 2019
Filing Date:
December 04, 2018
Export Citation:
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Assignee:
JAPAN DISPLAY INC. (3-7-1 Nishi-shinbashi, Minato-ku Tokyo, 03, 〒1050003, JP)
International Classes:
G01N23/046
Foreign References:
JP2017156328A2017-09-07
JP2003070776A2003-03-11
JP2001095789A2001-04-10
JP2017203752A2017-11-16
JP2006078251A2006-03-23
JP2017185219A2017-10-12
JP2006084467A2006-03-30
JP2011521754A2011-07-28
Attorney, Agent or Firm:
TAKAHASHI, HAYASHI AND PARTNER PATENT ATTORNEYS, INC. (Sonpo Japan Nipponkoa Kamata Building 9F, 5-24-2 Kamata Ota-k, Tokyo 52, 〒1440052, JP)
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