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Title:
X-RAY INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/224558
Kind Code:
A1
Abstract:
[Problem] To provide an X-ray inspection device comprising a processing means for taking in and processing X-ray images acquired by a two-dimensional X-ray detector disposed such that the two-dimensional X-ray detector and an X-ray generator sandwich a body under inspection, the X-ray inspection device being capable of generating a CT image for the entirety of a relatively large body under inspection even if the storage capacity of the memory of the processing means is reduced. [Solution] By alternatingly carrying out an image acquisition operation and a movement operation, an X-ray inspection device 1 causes a two-dimensional X-ray detector 4 to acquire, over 360° and at prescribed angular intervals in a relative rotation direction, X-ray images of a body 2 under inspection that are divided in the left-right direction and are of a prescribed position in the vertical direction. After taking in a prescribed number of X-ray images, a processing means for taking in and processing the X-ray images acquires, from the acquired X-ray images, CT image creation data including the coordinates of prescribed positions in the acquired X-ray images and the brightnesses at the coordinates, and starts prescribed computation for generating a CT image of the body under inspection using the CT image creation data.

Inventors:
KINOSHITA OSAMU (JP)
Application Number:
PCT/JP2022/005874
Publication Date:
October 27, 2022
Filing Date:
February 15, 2022
Export Citation:
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Assignee:
JED CO LTD (JP)
International Classes:
G01N23/046
Domestic Patent References:
WO2017203886A12017-11-30
WO2015128969A12015-09-03
WO2019208037A12019-10-31
Foreign References:
CN109187591A2019-01-11
JP2007229473A2007-09-13
JP2008173233A2008-07-31
JP2014124217A2014-07-07
JP2011050494A2011-03-17
JP2008180651A2008-08-07
JP2012125553A2012-07-05
Attorney, Agent or Firm:
KODAIRA Shin (JP)
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