Title:
X-RAY INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/224558
Kind Code:
A1
Abstract:
[Problem] To provide an X-ray inspection device comprising a processing means for taking in and processing X-ray images acquired by a two-dimensional X-ray detector disposed such that the two-dimensional X-ray detector and an X-ray generator sandwich a body under inspection, the X-ray inspection device being capable of generating a CT image for the entirety of a relatively large body under inspection even if the storage capacity of the memory of the processing means is reduced. [Solution] By alternatingly carrying out an image acquisition operation and a movement operation, an X-ray inspection device 1 causes a two-dimensional X-ray detector 4 to acquire, over 360° and at prescribed angular intervals in a relative rotation direction, X-ray images of a body 2 under inspection that are divided in the left-right direction and are of a prescribed position in the vertical direction. After taking in a prescribed number of X-ray images, a processing means for taking in and processing the X-ray images acquires, from the acquired X-ray images, CT image creation data including the coordinates of prescribed positions in the acquired X-ray images and the brightnesses at the coordinates, and starts prescribed computation for generating a CT image of the body under inspection using the CT image creation data.
Inventors:
KINOSHITA OSAMU (JP)
Application Number:
PCT/JP2022/005874
Publication Date:
October 27, 2022
Filing Date:
February 15, 2022
Export Citation:
Assignee:
JED CO LTD (JP)
International Classes:
G01N23/046
Domestic Patent References:
WO2017203886A1 | 2017-11-30 | |||
WO2015128969A1 | 2015-09-03 | |||
WO2019208037A1 | 2019-10-31 |
Foreign References:
CN109187591A | 2019-01-11 | |||
JP2007229473A | 2007-09-13 | |||
JP2008173233A | 2008-07-31 | |||
JP2014124217A | 2014-07-07 | |||
JP2011050494A | 2011-03-17 | |||
JP2008180651A | 2008-08-07 | |||
JP2012125553A | 2012-07-05 |
Attorney, Agent or Firm:
KODAIRA Shin (JP)
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