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Patent Searching and Data


Title:
X-RAY IRRADIATION DEVICE AND ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2011/122020
Kind Code:
A1
Abstract:
Provided are a X-ray irradiation device capable of adjusting the energy of X-rays over a wide range, and an analysis device provided with the X-ray irradiation device. In the X-ray irradiation device, X-rays emitted from a X-ray generation mechanism are focused on a predetermined focal point by a light focusing mechanism. The X-ray generation mechanism is comprised of a structure for generating several types of X-ray having different wavelengths. The light focusing mechanism is comprised of a structure in which the X-rays are focused on the same focal point by light focusing elements having diffraction characteristics suitable for the wavelengths of the X-rays generated by the X-ray generation mechanism.

Inventors:
YAMAZUI HIROMICHI (JP)
KOBAYASHI KEISUKE (JP)
IWAI HIDEO (JP)
KOBATA MASAAKI (JP)
Application Number:
PCT/JP2011/001904
Publication Date:
October 06, 2011
Filing Date:
March 30, 2011
Export Citation:
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Assignee:
NAT INST FOR MATERIALS SCIENCE (JP)
ULVAC PHI INC (JP)
YAMAZUI HIROMICHI (JP)
KOBAYASHI KEISUKE (JP)
IWAI HIDEO (JP)
KOBATA MASAAKI (JP)
International Classes:
G01N23/227; H05G2/00; H05G1/70
Foreign References:
JPH11281597A1999-10-15
JP2009500642A2009-01-08
JPH07325052A1995-12-12
JPH0453548U1992-05-07
JP2005216578A2005-08-11
JP2001351551A2001-12-21
JP2002228609A2002-08-14
JPH07325052A1995-12-12
JP2001133421A2001-05-18
Other References:
MASAAKI KOBATA ET AL.: "Development of the Hard-X-ray Angle Resolved X-ray Photoemission Spectrometer for Laboratory Use", ANALYTICAL SCIENCES, vol. 26, February 2010 (2010-02-01), pages 227 - 232
J. A. BERDEN: "X-Ray Wavelengths", REVIEW OF MODERN PHYSICS, vol. 39, no. 1, 1967, pages 78 - 124
Attorney, Agent or Firm:
OMORI, JUNICHI (JP)
Omori Junichi (JP)
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Claims: