Title:
X-RAY PHASE DIFFERENCE IMAGING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2020/090168
Kind Code:
A1
Abstract:
This X-ray phase difference imaging system (100) comprises an X-ray source (1), a detector (5), a plurality of gratings, a rotation mechanism (8) for rotating a subject (T) and an imaging system (11) in relation to each other, an image processing unit (6) for generating at least a dark field image (22) resulting from X-ray scattering for each of a plurality of rotation angles produced through rotation by the rotation mechanism, and a control unit (7) for controlling imaging condition switching on the basis of the amount of X-ray scattering caused by the rotation angle when the subject is imaged.
Inventors:
SHIRAI TARO (JP)
KIMURA KENJI (JP)
DOKI TAKAHIRO (JP)
MORIMOTO NAOKI (JP)
KIMURA KENJI (JP)
DOKI TAKAHIRO (JP)
MORIMOTO NAOKI (JP)
Application Number:
PCT/JP2019/029232
Publication Date:
May 07, 2020
Filing Date:
July 25, 2019
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N23/041; G01N23/046
Foreign References:
| JP2013524897A | 2013-06-20 | |||
| JP2017524139A | 2017-08-24 | |||
| US20170227476A1 | 2017-08-10 | |||
| JP2003079611A | 2003-03-18 | |||
| JP2009279289A | 2009-12-03 | |||
| JPH07204189A | 1995-08-08 | |||
| JP2003290214A | 2003-10-14 | |||
| JP2006214879A | 2006-08-17 |
Attorney, Agent or Firm:
MIYAZONO, Hirokazu (JP)
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