X-RAY PHASE IMAGING DEVICE

Title:

X-RAY PHASE IMAGING DEVICE

Document Type and Number:

WIPO Patent Application WO/2020/079919

Kind Code:

A1

Abstract:

This X-ray phase imaging device (100) comprises: an X-ray source (1); a detector (2); a plurality of gratings including a first grating (3) and second grating (4); and an image processing unit (5) for generating a phase contrast image (15). The relative placements of the first grating and the X-ray source or the focal spot size of the X-ray source is adjusted such that the detector does not detect an enlarged projection of the grating pattern of the first grating.

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Inventors:

DOKI TAKAHIRO (JP)
KIMURA KENJI (JP)
SHIRAI TARO (JP)
MORIMOTO NAOKI (JP)

Application Number:

PCT/JP2019/030165

Publication Date:

April 23, 2020

Filing Date:

August 01, 2019

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Assignee:

SHIMADZU CORP (JP)

International Classes:

G01N23/041; H05G1/52

Domestic Patent References:

WO2007125833A1

2007-11-08

Foreign References:

JP2018029777A	2018-03-01
JP2018155502A	2018-10-04
CN108469443A	2018-08-31

Attorney, Agent or Firm:

MIYAZONO, Hirokazu (JP)

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