X-RAY PHASE IMAGING DEVICE

Title:

X-RAY PHASE IMAGING DEVICE

Document Type and Number:

WIPO Patent Application WO/2022/113416

Kind Code:

A1

Abstract:

This X-ray phase imaging device (100) comprises an X-ray source (1), an X-ray detector (2), a plurality of gratings, a subject placement part (21) that is disposed within an X-ray irradiation range and upon which a subject (90) is placed, and an image processing unit (71) that generates an X-ray phase contrast image (40) on the basis of an X-ray intensity distribution detected by the X-ray detector. The subject placement part is formed from a first material having a greater X-ray transmittance than metal and a lower degree of X-ray scattering than metal.

Inventors:

DOKI TAKAHIRO (JP)
KIMURA KENJI (JP)
SHIRAI TARO (JP)
MORIMOTO NAOKI (JP)

Application Number:

PCT/JP2021/025645

Publication Date:

June 02, 2022

Filing Date:

July 07, 2021

Export Citation:

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Assignee:

SHIMADZU CORP (JP)

International Classes:

G01N23/041; G01N23/046

Foreign References:

JP2019144177A	2019-08-29
JP2017072399A	2017-04-13
JP2015083932A	2015-04-30