X-RAY PHASE IMAGING DEVICE AND X-RAY PHASE IMAGING ANALYSIS METHOD

Title:

X-RAY PHASE IMAGING DEVICE AND X-RAY PHASE IMAGING ANALYSIS METHOD

Document Type and Number:

WIPO Patent Application WO/2024/070230

Kind Code:

A1

Abstract:

This X-ray phase imaging device (100) comprises: an X-ray light source (10), an X-ray detector (11), a plurality of lattices; a rotary mechanism (15) which rotates a subject (90) including fibers (91a) and the plurality of lattices relative to each other; an image processing unit (2a) which generates a plurality of X-ray phase contrast images (40) for each of the orientations of the subject with respect to the plurality of lattices; and a control unit (2b) which acquires orientation information (30) pertaining to the orientations of fibers included in the subject on the basis of the plurality of X-ray phase contrast images, and acquires a feature amount (31) pertaining to the mechanical strength of the subject.

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Inventors:

DOKI TAKAHIRO (JP)
KIMURA KENJI (JP)
MORIMOTO NAOKI (JP)
NAGAI ISHIKAWA (JP)

Application Number:

PCT/JP2023/028534

Publication Date:

April 04, 2024

Filing Date:

August 04, 2023

Export Citation:

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Assignee:

SHIMADZU CORP (JP)

International Classes:

G01N23/041

Attorney, Agent or Firm:

MIYAZONO, Hirokazu (JP)

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