X-RAY SOURCE, AND FLUORESCENT X-RAY ANALYZING DEVICE

Title:

X-RAY SOURCE, AND FLUORESCENT X-RAY ANALYZING DEVICE

Document Type and Number:

WIPO Patent Application WO/2007/088934

Kind Code:

A1

Abstract:

Provided are an X-ray source for emitting a characteristic X-ray, and a fluorescent X-ray analyzing device using the X-ray source. A secondary target (119) is superimposed on a primary target (118). An electron beam (115) generated by an electron gun (114) is incident on the primary target (118), and this primary target (118) transmits and emits a continuous X-ray. The second target (119) transmits and emits a characteristic X-ray (121), which is excited with the continuous X-ray emitted from the primary target (118). The primary target (118) and the secondary target (119) are superimposed to make the continuous X-ray emitted from the primary target (118), efficient for the excitation of the secondary target (119) thereby to generate the characteristic X-ray (121) efficiently.

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Inventors:

AOKI NOBUTADA (JP)
KAKUTANI AKIKO (JP)

Application Number:

PCT/JP2007/051710

Publication Date:

August 09, 2007

Filing Date:

February 01, 2007

Export Citation:

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Assignee:

TOSHIBA ELECTRON TUBES & DEVIC (JP)
AOKI NOBUTADA (JP)
KAKUTANI AKIKO (JP)

International Classes:

H01J35/08; G01N23/223; H01J35/10; H01J35/18; H01J35/26

Foreign References:

JP2001155670A	2001-06-08
JP2001008925A	2001-01-16

Other References: