Title:
X-RAY TUBE FAULT INDICATOR SENSING DEVICE, X-RAY TUBE FAULT INDICATOR SENSING METHOD, AND X-RAY IMAGING DEVICE
Document Type and Number:
WIPO Patent Application WO/2015/182317
Kind Code:
A1
Abstract:
A learning unit (25) in learning mode generates a cluster from a cluster analysis of data formed from frequency constituent data (Fa) and state data (x, y, z, T, θ), obtained from a sensor unit (13). An abnormality calculation unit (26) computes, as abnormalities (Sd), the minimum values among distances to surfaces of the clusters of the data formed from the frequency constituent data (Fa) and the state data (x, y, z, T, θ), obtained when in fault indicator sensing mode. A fault indicator determination unit (27) determines a fault indicator of an X-ray tube (12) by comparing the abnormalities (Sd) with a predetermined threshold.
Inventors:
NAKAHARA TAKASHI (JP)
YUDA SHINYA (JP)
AONO TAKANORI (JP)
INAHARA TETSU (JP)
SEKI YOSHITAKA (JP)
AKITA KOUJI (JP)
ABE KIYOMI (JP)
YUDA SHINYA (JP)
AONO TAKANORI (JP)
INAHARA TETSU (JP)
SEKI YOSHITAKA (JP)
AKITA KOUJI (JP)
ABE KIYOMI (JP)
Application Number:
PCT/JP2015/062738
Publication Date:
December 03, 2015
Filing Date:
April 27, 2015
Export Citation:
Assignee:
HITACHI MEDICAL CORP (JP)
International Classes:
A61B6/03; H05G1/26; H05G1/66
Foreign References:
| JP2001218762A | 2001-08-14 | |||
| JP2002280195A | 2002-09-27 | |||
| JP2009011586A | 2009-01-22 |
Attorney, Agent or Firm:
ISONO INTERNATIONAL PATENT OFFICE, P. C. (JP)
Patent business corporation Isono international patent trademark office (JP)
Patent business corporation Isono international patent trademark office (JP)
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