Title:
AN XRF ANALYZER FOR IDENTIFYING A PLURALITY OF SOLID OBJECTS, A SORTING SYSTEM AND A SORTING METHOD THEREOF
Document Type and Number:
WIPO Patent Application WO/2017/221246
Kind Code:
A8
Abstract:
The present invention discloses a novel XRF analyzer capable of simultaneously identifying the presence of a marking composition in a plurality of objects by modulating/varying the intensity of the excitation beam on the different objects and measuring the secondary radiation thereof. The XRF analyzer comprises a radiation emitter assembly adapted for emitting at least one X-Ray or Gamma-Ray excitation radiation beam having a spatial intensity distribution for simultaneously irradiating the plurality of objects; a radiation detector for detecting secondary radiation X-Ray signals arriving from a plurality of objects in response to irradiation of the objects by X-Ray or Gamma-Ray radiation, and providing data indicative of spatial intensity distribution of the detected data X-Ray signals on the plurality of objects; and a signal reading processor in communication with the detector, the processor being adapted for receiving and processing the detected response X-Ray signals to verify presence of the marking composition included at least one surface of each object of the plurality objects.
Inventors:
GROF YAIR (IL)
KISLEV TZEMAH (IL)
YORAN NADAV (IL)
ALON HAGGAI (IL)
KAPLINSKY MOR (IL)
KISLEV TZEMAH (IL)
YORAN NADAV (IL)
ALON HAGGAI (IL)
KAPLINSKY MOR (IL)
Application Number:
PCT/IL2017/050688
Publication Date:
February 22, 2018
Filing Date:
June 21, 2017
Export Citation:
Assignee:
SOREQ NUCLEAR RES CT (IL)
SECURITY MATTERS LTD (IL)
SECURITY MATTERS LTD (IL)
International Classes:
G01N23/223; B07C5/34
Attorney, Agent or Firm:
SCHNUR, Myriam (IL)
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