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WO/2024/044966A1 |
The present application provides an electrode plate detection apparatus, which is capable of effectively measuring the surface density of an electrode plate material over a whole area. The apparatus comprises: a radiation mechanism, wher...
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WO/2024/042702A1 |
Provided is a computer system that provides a function for extracting, from image data, coordinate information of base points for measuring dimensions of a desired portion of a pattern of the image data, and measuring the dimensions usin...
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WO/2024/032986A1 |
The invention relates to a calibration apparatus for a measurement device and to a method for calibrating the measurement device for the purpose of analysing materials or layer thicknesses using a calibration apparatus (11), consisting o...
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WO/2024/023955A1 |
In the present invention, a measurement-subject captured image in which a specimen is captured is converted to a measurement-subject length-measurement image by a length-measurement image conversion model, and the dimensions of a measure...
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WO/2024/020443A1 |
A system for monitoring vehicle battery health having a radar antenna array, a SPR system and a battery system. The radar antenna array transmitting and receiving SPR signals. The SPR system driving the antennas to emit radar signals and...
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WO/2024/004990A1 |
Provided are a thickness measuring method, an X-ray analysis device, an information processing device, and a computer program that can measure the thicknesses of more multilayer samples as compared to conventional means. This thickness...
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WO/2024/005006A1 |
Provided are a thickness measurement method, an X-ray analysis device, an information processing device, and a computer program, with which it is possible to measure the thickness of each layer of a multilayer material that heretofore ha...
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WO/2023/249806A1 |
A wafer metrology tool, such as a scanning electron microscope, can generate an image of a structure on a wafer. A simulated image of the structure also is determined from a design of the wafer. A contour of the structure in the image an...
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WO/2023/233983A1 |
This indicator calculation method for fine wires includes a step for obtaining x-ray images of a plurality of cross-sections that are orthogonal to the longitudinal direction of a cable that includes a plurality of fine wires, a step for...
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WO/2023/233492A1 |
According to the present invention, a design image based on design data is set for each image acquisition condition, and a length measurement cursor is set in each of the design images. This recipe creating system for creating a recipe i...
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WO/2023/230281A1 |
A method includes: navigating a spray nozzle across and applying a coating to a region of a structure via the spray nozzle; illuminating the coating applied to the region; detecting an intensity of light emitted by the coating at the reg...
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WO/2023/217929A1 |
The invention relates to a non-destructive inspection method based on 3D modelling of a part (200), comprising: - using an x-ray device (100) to acquire images of the part at various projection angles (I(n)); - computing projections base...
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WO/2023/201941A1 |
A scanning-type microwave vibration and deformation measurement method and system. The method comprises: simultaneously emitting linear frequency modulation continuous waves by means of a plurality of transmitting antennas, wherein a mai...
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WO/2023/196167A1 |
A simulated tool signal is determined from design data and tool properties of the tool making the measurements. A design-assisted composite signal is determined from measurements. An edge placement uniformity signal is then determined by...
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WO/2023/193933A1 |
Systems are provided for contactless determining a physical feature of a target item. Such systems comprise a scanner unit, a detector unit and a determiner unit. The scanner unit is configured to operate according to a relative position...
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WO/2023/188064A1 |
The present invention provides a power supply system capable of storing and releasing hydrogen efficiently. The power supply system comprises: a hydrogen storage unit (73); a holding unit (74) including a first holding device (74a) tha...
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WO/2023/190743A1 |
A measuring device 1 according to the present disclosure employs radiation to measure a thickness of an object being measured, and comprises an interrupting unit 10 capable of interrupting radiation emitted by a radiation source, and a f...
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WO/2023/189889A1 |
Provided is a measurement system including: a plurality of frames that each measure a sheet being conveyed by means of scanning; and a synchronization control unit that synchronously controls the individual frames, wherein the synchroniz...
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WO/2023/190915A1 |
This measurement device 10 comprises: a measurement unit 20 having a radiation source 22 for emitting radiation at a measurement object 80, and a detector 24 for detecting the radiation that has been transmitted through the measurement o...
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WO/2023/173049A1 |
Disclosed is a system and a method for estimating a level of risk of operation of a metallurgical vessel used in the formation of metals. The system and method are operative to determine a condition and level of degradation of the refrac...
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WO/2023/166748A1 |
A profile detection method according to the present invention includes a detection step and an output step. The detection step is for using a trained model using a training image including a specific form and information pertaining to th...
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WO/2023/150755A1 |
Computed tomography (CT) scanning while a part is maintained at low temperatures is described. A system includes a CT scan machine performing at least one 360° CT scan of the part. The system also includes a cooler to contain and mainta...
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WO/2023/146205A1 |
The present invention relates to a variable detector and an image-capturing apparatus comprising same. The present invention provides a detector comprising: a first portion including a first housing made of an elastic material, and a det...
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WO/2023/144909A1 |
In this foreign body height measuring method for measuring a height of a foreign body on a specimen, from a charged particle image acquired with a specimen stage in an inclined state: dependency data representing a dependency of a calcul...
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WO/2023/144861A1 |
In order to more appropriately provide information pertaining to a structure, an information providing system according to the present invention comprises: a displacement acquisition means that acquires the displacement of a structure on...
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WO/2023/144860A1 |
In order to more suitably process information about a structure, an information processing system according to the present invention comprises: a displacement acquisition means which acquires a displacement of the structure on the ground...
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WO/2023/128833A1 |
The invention relates to the field of 3D printing technology and can be used in practically any sector of industry for producing three-dimensional items and objects for different purposes, and more particularly relates to a multi-compone...
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WO/2023/110593A1 |
A method for preparing surrogate calibration standards for web gauging, is provided. The method includes providing linearizations for one or more radiometric gauges, each linearization associated with a radiometric gauge and relating the...
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WO/2023/101800A1 |
A method of identifying at least one pole location on a bearing element formed from a metal source element. The method is non-destructive and does not alter the surface of the bearing element. The method includes applying X-rays to a plu...
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WO/2023/087453A1 |
A direct X-ray image detector and a method for manufacturing same. The method for manufacturing the direct X-ray image detector comprises the following steps: synthesizing a long-chain organic carboxylic acid and an organic ligand into a...
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WO/2023/087652A1 |
Disclosed in the present invention is a dual-light-source X-ray security instrument-oriented method for automatically measuring the size of an object to be inspected. An imaging model of a scale of an X-ray image with respect to an actua...
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WO/2023/079555A1 |
A measurement device is presented configured as an inclinometer for measuring a tilt angle of an object with respect to of a reference plane. The measurement device comprises: a measuring unit capable of measuring at least first and seco...
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WO/2023/067580A1 |
A system to characterize a film layer within a measurement box is disclosed. The system obtains a first mixing fraction corresponding to a first X-ray beam, the mixing fraction represents a fraction of the first X-ray beam inside a measu...
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WO/2023/047442A1 |
This information provision device provides a user of observation data obtained by synthetic aperture radar (SAR) with information regarding the tilt of a building. A detection unit (12) acquires measurement data of the amount of displace...
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WO/2023/047441A1 |
According to the present invention, a user of observation data obtained by synthetic aperture radar (SAR) is provided with information relating to ground surface displacement. An acquiring unit (12) acquires measured data of an amount of...
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WO/2023/036593A1 |
Described herein is a metrology system and a method for converting metrology data via a trained machine learning (ML) model. The method includes accessing a first (MD1) SEM data set (e.g., images, contours, etc.) acquired by a first scan...
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WO/2023/027866A1 |
Analyzing a sidewall of a hole milled in a sample to determine thickness of a buried layer includes milling the hole in the sample using a charged particle beam of a focused ion beam (FIB) column to expose the buried layer along the side...
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WO/2023/027227A1 |
A system for inspecting a defect in a structure according to the present invention comprises: an X-ray generation apparatus which moves by means of a first movement apparatus so as to be able to irradiate the structure with X-rays; an X-...
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WO/2023/007052A1 |
The present invention relates to a device (1) for the calibration of images, said device being made from a material (2) that is radiolucent to radiation that, upon striking a first object (3) of which the dimensions are to be obtained, p...
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WO/2023/000540A1 |
Provided are a method for measuring a burden surface profile of a blast furnace, a terminal device for measuring a burden surface profile of a blast furnace, and a computer-readable storage medium. The method comprises: S1, measuring the...
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WO/2023/003674A1 |
Analyzing a buried layer on a sample includes milling a spot on the sample using a charged particle beam of a focused ion beam (FIB) column to expose the buried layer along a sidewall of the spot. From a first perspective a first distanc...
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WO/2023/004193A1 |
Systems and methods for detecting and imaging high Z agents within anatomy of a subject are provided. A fast photon counting detector array is positioned relative to the subject to detect coincident photons having 511 keV energy and oppo...
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WO/2023/286211A1 |
This invention carries out highly accurate fitting to a complex shape that can be generated by semiconductor processing. A shape model derives shape model parameter constraints on the basis of a machining dimension domain and a machining...
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WO/2022/249489A1 |
Provided is a depth measurement system comprising a plurality of depth measurement devices which each calculate a depth index value indicating the relative depth of a pattern on a sample, wherein: the plurality of depth measurement devic...
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WO/2022/242204A1 |
An object detecting method and apparatus, an electronic device, and a storage medium. The object detecting method comprises: acquiring a first detection signal output by a millimeter wave radar which is configured to scan an object under...
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WO/2022/213274A1 |
A universal CT axis alignment method, comprising the following steps: imaging a positioning point at three rotation angle positions; and according to an imaging geometric relationship, calculating the position of the positioning point re...
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WO/2022/209022A1 |
This rotating chute inner surface wear testing apparatus (9) is for testing the wear of a surface of a liner (32) attached to an inner surface of a chute (21) provided in a charging device (20) of a blast furnace (10). The rotating chute...
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WO/2022/212281A1 |
A method includes identifying first structure data of a first region of a substrate and receiving optical metrology data of the substrate associated with one or more substrate deposition processes in a processing chamber. The method furt...
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WO/2022/195964A1 |
In order to more reliably remove a fluid from a radiation path in a thickness measurement device, a thickness measurement device according to an embodiment of the present invention comprises: a radiation source that emits radiation onto ...
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WO/2022/190654A1 |
This inspection system includes: a first inspecting means for implementing a first inspection on the basis of first image data obtained by imaging an inspection target object by means of a first image capturing means; a second inspecting...
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