Title:
CRYSTAL MATERIAL ANALYSIS DEVICE, CRYSTAL MATERIAL ANALYSIS METHOD AND CRYSTAL MATERIAL ANALYSIS PROGRAM
Document Type and Number:
Japanese Patent JP2021124964
Kind Code:
A
Abstract:
To provide a crystal material analysis device useful for analysis of a crystal material.SOLUTION: A crystal material analysis device has: a graph creation unit that creates a loop graph having intra-lattice nodes representing atoms in one unit lattice of a crystal material, intra-lattice edges showing chemical bonds between atoms in the unit lattice, and a loop edge showing a virtual chemical bond between an atom X in the unit lattice and an atom Y in the unit lattice corresponding to an atom Y' in an adjacent unit lattice adjacent to the unit lattice, wherein the atom Y' has the chemical bond with the atom X in the unit lattice; and an analysis unit that analyzes a crystal material using the graph.SELECTED DRAWING: Figure 12
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Inventors:
KURITA TOMOCHIKA
OBUCHI MARI
OBUCHI MARI
Application Number:
JP2020018085A
Publication Date:
August 30, 2021
Filing Date:
February 05, 2020
Export Citation:
Assignee:
FUJITSU LTD
International Classes:
G16C20/30; G06F30/10; G16C20/80
Attorney, Agent or Firm:
Koichi Hirota