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Title:
【発明の名称】複数条件蛍光X線定性分析方法
Document Type and Number:
Japanese Patent JP2821656
Kind Code:
B2
Abstract:
A method and apparatus for measuring fluorescent X-rays from a sample include an X-ray voltage tube having a variable applied voltage during the measurement cycle. The resulting fluorescent X-rays are measured by a detector that output representative signals. The representative signals are used to calculate a characteristic energy spectrum which can be displayed to an operator. The use of a varying voltage ensures detecting both light and heavy elements. An X-ray filter can also be inserted to prevent any characteristic X-rays from being generated from the X-ray gun itself.

Inventors:
Kira Akimichi
Yoshimichi Sato
Application Number:
JP29928992A
Publication Date:
November 05, 1998
Filing Date:
October 11, 1992
Export Citation:
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Assignee:
HORIBA, Ltd.
International Classes:
G01N23/223; G01N23/22; (IPC1-7): G01N23/223
Domestic Patent References:
JP6189548A
JP5240808A
JP239150U
JP1105855U
Attorney, Agent or Firm:
Hideo Fujimoto