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Title:
シングルビーム型の分光計及びシングルビーム型の分光計の操作方法
Document Type and Number:
Japanese Patent JP4124912
Kind Code:
B2
Abstract:
Background profiles for spectrometers are obtained by recording a number of background measurements over a period of time and analysing the measured data to create a statistical model of the instrument. The result is a set of stored background profiles with low noise level which are available when a sample measurement is made. The operator does not have to allow time to collect a background measurement as is the case in conventional techniques.

Inventors:
リチャード アンソニー スプラッグ
Application Number:
JP15363799A
Publication Date:
July 23, 2008
Filing Date:
June 01, 1999
Export Citation:
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Assignee:
パーキン-エルマー リミテッド
International Classes:
G01J3/45; G01N21/27; G01J3/28
Domestic Patent References:
JP6502492A
JP3226632A
JP7209082A
JP6347625A
JP6105220B2
JP6502247A
JP3504769A
JP8505221A
JP1113637A
Foreign References:
US5291426
WO1997028438A1
US4827132
WO1997018566A1
WO1996018881A1
WO1997004299A1
Attorney, Agent or Firm:
矢野 敏雄
山崎 利臣
久野 琢也