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Title:
半導体装置の作製方法
Document Type and Number:
Japanese Patent JP4554344
Kind Code:
B2
Abstract:

To provide a manufacturing process that employs a drop discharge method suitable for a large-sized substrate in terms of volume production considering that a signal delay problem due to the resistance of wiring will possibly become prominent when manufacturing a semiconductor apparatus having a large-area display.

The process includes steps of, forming a foundation layer 11 (or to pre-treat for the foundation layer) beforehand on a substrate that improves its adhesiveness, and forming a mask of a desired pattern shape, which is used to form a desirable concave portion after forming an insulation film. The drop discharge method is used to fill a metal material into the concave portion that has a side wall composed of a mask 13 and the insulation film, thus forming embedded wiring (a gate electrode 15, a power line, guided wiring, and the like). After the mask 13 is removed, planarizing process, such as pressing and CMP, is performed to planarize the element.

COPYRIGHT: (C)2005,JPO&NCIPI


Inventors:
Hideaki Kuwahara
Shunpei Yamazaki
Shinji Maekawa
Osamu Nakamura
Application Number:
JP2004348620A
Publication Date:
September 29, 2010
Filing Date:
December 01, 2004
Export Citation:
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Assignee:
Semiconductor Energy Laboratory Co., Ltd.
International Classes:
G02F1/1333; H01L29/786; G02F1/1343; G02F1/1368; H01L21/28; H01L21/3205; H01L21/336; H01L23/52; H01L29/423; H01L29/49; H01L51/50; H05B33/14
Domestic Patent References:
JP2003318193A
JP3159174A
JP2003318401A
Foreign References:
WO2002067335A1