To decide a defect with high precision by eliminating a misdecision on a defective pixel of an imaging device without increasing a circuit scale.

A defect detection portion 2 detects a defect of an object pixel of defect detection in an image signal input to a defect detecting and correcting circuit 60 after being photoelectrically converted by the imaging device 22 and if a misdetection detection pattern detection portion 3 detects the defect detection object pixel signal and a pixel signal of its periphery having pixel signal pattern meeting designated conditions, a multiplexer 5 does not output a pixel signal corrected by a correction value generation portion 4 to a trailing-stage image processing portion 25 instead of the defect detection object pixel signal. Thus, it is possible to decide the defect with high precision by eliminating the misdecision on the defective pixel of the imaging device 22 without increasing the circuit scale.

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