Title:
表示装置の欠陥検出方法および表示装置の欠陥検出装置
Document Type and Number:
Japanese Patent JP4661293
Kind Code:
B2
Abstract:
To easily detect a progressive defect of a matrix structure.
The matrix structure has a plurality of gate lines 4c and 4d and a plurality of data lines 3a crossing each other in a lattice shape. Pixel portions 2a arranged at intersections of the plurality of gate lines 4c and 4d and the plurality of data lines 3a are applied with a designated driving voltage. A method for detecting a defect includes one of a stage of applying a voltage larger than the driving voltage to a pixel portion to accelerate development of the defect 110 and a stage of continuously applying the driving voltage to the pixel portion 2a to accelerate the development of the defect 110.
COPYRIGHT: (C)2007,JPO&INPIT
Inventors:
Norikazu Komatsu
Application Number:
JP2005085833A
Publication Date:
March 30, 2011
Filing Date:
March 24, 2005
Export Citation:
Assignee:
Seiko Epson Corporation
International Classes:
G02F1/133; G01R31/00; G02F1/13; G02F1/1368; G09G3/20; G09G3/36; G01M11/00
Domestic Patent References:
| JP9159997A | ||||
| JP7294374A | ||||
| JP2003241156A |
Attorney, Agent or Firm:
Kazuya Nishi
Masatake Shiga
Masakazu Aoyama
Masatake Shiga
Masakazu Aoyama