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Title:
蛍光X線分析方法および蛍光X線分析装置
Document Type and Number:
Japanese Patent JP4755594
Kind Code:
B2
Abstract:
The concentration(s) of element(s) contained in an unknown sample is measured without necessity of judging the sample relying on a human's eye and obtaining information from a supplier of the sample previously. The concentration(s) of trace element(s) such as Cd, Pb and Hg contained in parts for electronic or electric equipment is determined by (1) irradiating the sample with an X-ray so as to identify whether the type of the sample is a nonmetal-based material or a metal-based material; (2) selecting measuring conditions for a fluorescent X-ray analysis depending on the identified type of the sample; and (3) measuring the concentration(s) of one or more element(s) contained in the sample by the fluorescent X-ray analysis according to the selected measuring conditions.

Inventors:
Miyuki Tani
Hiroshi Iwamoto
Takao Hisakuno
Iwata Nobuhiro
Etsumi Sakaguchi
Application Number:
JP2006531377A
Publication Date:
August 24, 2011
Filing Date:
July 21, 2005
Export Citation:
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Assignee:
Panasonic Corporation
International Classes:
G01N23/223
Domestic Patent References:
JP2000121584A2000-04-28
JPH0763711A1995-03-10
JP2000193615A2000-07-14
Attorney, Agent or Firm:
Samejima Mutsumi
Kyousei Tamura