Title:
導電材料製物体中の異常の検出
Document Type and Number:
Japanese Patent JP4903349
Kind Code:
B2
Abstract:
Detecting the presence of an anomaly in or near an object using a probe comprises:a) selecting a set of points on the near surface which are to be inspected, and selecting a first direction and a second direction;b) selecting a first inspection point from the set;c) positioning the probe at the selected inspection point in the first direction, inducing eddy currents in the object and determining a characteristic value of the electromagnetic field;d) positioning the probe in the second direction at the selected inspection point, inducing eddy currents in the object and determining a characteristic value of the electromagnetic field;e) selecting a next inspection point from the set and repeating steps c) and d) until all inspection points have had their turn; andf) inferring that an anomaly is present at an inspection point if a combination of the characteristic values in the first and second direction deviates significantly from a norm.
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Inventors:
Paulus Carolus Nicolas Crouzen
Marc Theodor Royer
Johann Van der Steen
Marc Theodor Royer
Johann Van der Steen
Application Number:
JP2002521968A
Publication Date:
March 28, 2012
Filing Date:
August 23, 2001
Export Citation:
Assignee:
SHELL INTERNATIONALE RESEARCH MAATSCHAPPIJ BESLOTEN VENNOOTSHAP
International Classes:
G01N27/90
Domestic Patent References:
| JP10197493A | ||||
| JP11248684A | ||||
| JP2004507721A | ||||
| JP2004507734A | ||||
| JP2004507735A |
Attorney, Agent or Firm:
Okumura Yoshimichi