Title:
微小粒子分析装置及び微小粒子分析方法
Document Type and Number:
Japanese Patent JP5765022
Kind Code:
B2
Abstract:
A fine particle analyzing apparatus includes a light irradiation unit configured to irradiate a fine particle that flows in a flow path with a laser beam, and a detection unit configured to detect light emitted from the fine particle that is irradiated with the laser beam. In the fine particle analyzing apparatus, the light irradiation unit includes at least a light source that is composed of a semiconductor laser, an optical fiber that converts a beam pattern of the laser beam generated from the light source into a top-hat type beam pattern, and a light source driving control unit configured to supply driving current, which is obtained by superimposing high-frequency current on direct current, to the light source.
Inventors:
Hironori Tanase
Sotoishi
Sotoishi
Application Number:
JP2011080621A
Publication Date:
August 19, 2015
Filing Date:
March 31, 2011
Export Citation:
Assignee:
ソニー株式会社
International Classes:
G01N15/14
Domestic Patent References:
| JP9178645A |
Foreign References:
| WO1992008120A1 |
Other References:
前田昌信,LDV計測の歴史と可能性 粒子を追って,自動車技術,1989年,Vol.43,No.11,6-11
GREHAN G et al,Combined measurements of velocity and size of supermicronic particles in flows using a top-hat laser beam technique,Particle Size Analysis 1985,1987年,409-421
GREHAN G et al,Simultaneous measurements of velocities and sizes of particles in flows using a combined system incorporating a top-hat beam technique ,Applied Optics,1986年,Vol.25,No.19,3527-3538
GREHAN G et al,Combined measurements of velocity and size of supermicronic particles in flows using a top-hat laser beam technique,Particle Size Analysis 1985,1987年,409-421
GREHAN G et al,Simultaneous measurements of velocities and sizes of particles in flows using a combined system incorporating a top-hat beam technique ,Applied Optics,1986年,Vol.25,No.19,3527-3538
Attorney, Agent or Firm:
Kaoru Watanabe