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Patent Searching and Data


Title:
測量システム
Document Type and Number:
Japanese Patent JP6621305
Kind Code:
B2
Abstract:
The invention provides a surveying system, which comprises a surveying instrument, wherein the surveying instrument comprises a measuring unit for performing a distance measurement by projecting a distance measuring light toward an object to be measured and by receiving a reflected distance measuring light from the object to be measured, an image pickup unit having an image pickup optical axis running in parallel to a projection optical axis of the distance measuring light and for picking up an image including the object to be measured, an attitude detecting unit provided integrally with the measuring unit and for detecting a tilt angle with respect to the horizontal of the measuring unit, a coordinates acquiring unit for detecting a position of the surveying instrument and an arithmetic processing unit, wherein a first image of the object to be measured is acquired by the image pickup unit from a first position where coordinates of the first position are acquired by the coordinates acquiring unit, a second image of the object to be measured is acquired by the image pickup unit from a second position where coordinates of the second position are acquired by the coordinates acquiring unit, wherein the measuring unit directs a distance measuring optical axis toward common measuring points as specified in the first image and the second image respectively, projects the distance measuring light, and carries out a first distance measurement from the first position and a second distance measurement from the second position, and wherein the arithmetic processing unit calculates horizontal distances from the first position and the second position respectively based on the tilt angles detected by the attitude detecting unit at the first position and the second position, on the first distance measurement and on the second distance measurement, and further the arithmetic processing unit is configured to calculate a base line length based on coordinates of the first position and on coordinates of the second position and to carry out a trilateration with respect to the measuring point based on the horizontal distance and on the base line length.

Inventors:
Fumio Otomo
Kaoru Kumagai
Hitoshi Otani
Tetsuji Anai
Application Number:
JP2015220474A
Publication Date:
December 18, 2019
Filing Date:
November 10, 2015
Export Citation:
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Assignee:
Topcon Co., Ltd.
International Classes:
G01C15/00; G01C11/06
Domestic Patent References:
JP3029812A
JP2012052946A
JP2006170688A
JP2009210388A
JP2007248156A
JP9243367A
Foreign References:
US20150268043
Attorney, Agent or Firm:
Shoji Miyoshi