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Patent Searching and Data


Title:
光分析装置及び光分析方法
Document Type and Number:
Japanese Patent JP6806147
Kind Code:
B2
Abstract:
A difference between a peak reflectance of a first wavelength component and a reflectance of a second wavelength component having a predetermined wavelength among reflectances of a plurality of wavelength components constituting reflected light in a highlight direction from a glitter material-containing coating film is set as a first difference value. Reflectance is measured of the first and second wavelength components of the reflected light in the highlight direction for the coating film corresponding to a measurement object. A first difference value is calculated by using the measurement result. A storage stores in advance correlation information indicating a correlation between the first difference value and an index value indicating predetermined physical characteristics of a glitter material contained in the coating film. An index value calculator calculates the index value of the coating film corresponding to the measurement object by using the correlation information and the first difference value calculated in the first calculator.

Inventors:
Yuta Yamanoi
Tomomi Setoguchi
Yoshitaka Teraoka
Application Number:
JP2018514534A
Publication Date:
January 06, 2021
Filing Date:
April 19, 2017
Export Citation:
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Assignee:
Konica Minolta Co., Ltd.
International Classes:
G01J3/50; C09D5/36; C09D201/00; G01N21/27; G01N21/57
Domestic Patent References:
JP2003294622A
JP2015529832A
JP2014193938A
JP201442892A
Foreign References:
WO2012147488A1
US20110234621
Attorney, Agent or Firm:
Etsushi Kotani
Masataka Otani
Satoshi Sakurai