Title:
テストプログラムデバッグ装置、半導体試験装置、テストプログラムデバッグ方法、及び試験方法
Document Type and Number:
Japanese Patent JPWO2005036402
Kind Code:
A
Inventors:
Ditch Mitsuo
Hideki Tada
夢川 The first son
Takahiro Kataoka
Hiroyuki Sekiguchi
Hideki Tada
夢川 The first son
Takahiro Kataoka
Hiroyuki Sekiguchi
Application Number:
JP2004014659W
Publication Date:
April 21, 2005
Filing Date:
October 05, 2004
Export Citation:
Assignee:
ADVANTEST CORP.
International Classes:
G01R31/28; G06F11/22; G06F11/28
Attorney, Agent or Firm:
Akihiro Ryuka