Title:
APPARATUS AND METHOD FOR MEASURING LIGHT EMISSION PATTERN OF LASER DIODE
Document Type and Number:
Japanese Patent JPH05196494
Kind Code:
A
Abstract:
PURPOSE:To provide the light emission pattern measuring device of a laser diode capable of ensuring the angular accuracy of a measuring range regardless of the mechanical adjustment accuracy of a rotary encoder or the optical axis shift of the laser diode. CONSTITUTION:In the light emission pattern measuring device of a laser diode measuring the intensity of the emitted beam of the laser diode attached to a measuring head by the photodiode provided to an arm whose angle of rotation is detected by a rotary encoder, the laser diode 11 is attached to the measuring head through a chuck 13. Positioning mechanisms capable of attaching the laser diode 11 by rotating the same around an emitting optical axis by 180 deg. are provided to the chuck 13 and the measuring head 12.
More Like This:
| JPH03231123 | FIXED STAR SENSOR |
| JP6417723 | Inspection equipment |
Inventors:
INOUE MASANORI
Application Number:
JP25852392A
Publication Date:
August 06, 1993
Filing Date:
September 28, 1992
Export Citation:
Assignee:
ADVANTEST CORP
International Classes:
G01J1/00; G01J1/02; G01M11/00; (IPC1-7): G01J1/00; G01J1/02
Attorney, Agent or Firm:
Wakabayashi Tadashi