Title:
CONTACT PROBE AND CONTACT PIN FOR INSPECTION OF ELECTRIC CONTINUITY OF IC SOCKET
Document Type and Number:
Japanese Patent JP2000150097
Kind Code:
A
Abstract:
To provide a contact probe assuring easy operations by preventing deformation and ununiformity of contact pins, facilitating replacement of deformed pins, and automating the opening of the open top of an IC socket.
A contact probe includes a contact head part whereto contact pins 7 arranged in rows in a groove provided in a contact support 9 fixed by a contact base 8 through a locating piece 10 are fixed by a contact locating plate 6, and a base block 3 incorporated with a receptacle 5 where a cable is connected, and the structure is such that the mentioned contact head part and base block 3 and a cable case 1 are coupled together by screws.
Inventors:
SATO TAICHIRO
Application Number:
JP36601698A
Publication Date:
May 30, 2000
Filing Date:
November 16, 1998
Export Citation:
Assignee:
SATO TAICHIRO
International Classes:
G01R31/02; G01R31/26; H01L21/66; H01L23/32; H01R33/76; H01R13/04; (IPC1-7): H01R33/76; G01R31/02; G01R31/26; H01L21/66; H01L23/32; H01R13/04