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Title:
DEFECT INSPECTING DEVICE
Document Type and Number:
Japanese Patent JPS60131411
Kind Code:
A
Abstract:

PURPOSE: To attain labor saving and rationalization by coding the output of reflected light from a plane of a body to be inspected into a binary signal, and deciding whether the total number of bits having logic corresponding to the reflection from the plane is larger than a specific value or not.

CONSTITUTION: Projecting devices 3a and 3b project light upon the entire top surface of the body 1 to be inspected which is moved by a conveying device 2 in parallel. A photoelectric converting device 4 which incorporates a lens whose focal length is set small enough to focus only an image of the top surface of the objective body 1 makes a scan at right angles to the moving direction of the objective body 1. The moving direction of the objective body 1 coincides with one of ridge directions of ridges to be inspected preferably. While the output of a position detector 6 indicates that the objective body 1 is at a position to be inspected, the entire top surface of the objective body 1 is irradiated by the projecting devices 3a and 3b and the photoelectric converting device 4 makes the scan.


Inventors:
SHIYUDOU YUUKICHI
IWAI SHIGEO
Application Number:
JP24045283A
Publication Date:
July 13, 1985
Filing Date:
December 20, 1983
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
G01B11/24; G01B11/30; G01N21/956; (IPC1-7): G01B11/24
Attorney, Agent or Firm:
Masuo Oiwa



 
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