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Patent Searching and Data


Title:
DEVICE, METHOD, AND PROGRAM FOR MEASURING PARTICULATE MATERIAL
Document Type and Number:
Japanese Patent JP2021076547
Kind Code:
A
Abstract:
To allow a measurement of a PM deposition amount as well when a filter formed of a conductor is used.SOLUTION: A DPF is irradiated with a microwave obtained by performing a frequency sweep on a reference sine wave integral multiple times, an impedance change amount, which is the difference between an impedance calculated from a reflection wave of the microwave and a reflection wave when a particulate material is not deposited on the DPF, is calculated, and the amount of particulate materials deposited on the DPF is calculated on the basis of the impedance change amount.SELECTED DRAWING: Figure 2

Inventors:
SATO YU
Application Number:
JP2019205452A
Publication Date:
May 20, 2021
Filing Date:
November 13, 2019
Export Citation:
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Assignee:
TRANSTRON INC
International Classes:
G01N22/00
Attorney, Agent or Firm:
Yukari Sakata