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Title:
DISPLAY DEVICE AND INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2010243643
Kind Code:
A
Abstract:

To provide a display device precisely measuring a leak current and an inspection device.

A liquid crystal panel 1 includes: a gate dummy pixel 14Dg and a source dummy pixel 14Ds arranged on the outer peripheral side of a display area 2; a test switch line 31 connected to dummy TFTs 13Dg and 13Ds of the gate dummy pixel 14Dg and the source dummy pixel 14Ds to switch their conduction states; a test gate line 32 connected to a dummy pixel electrode 12Dg, which is arranged in gate lines G not adjacent to each other among a plurality of gate lines G, to divide the gate lines G into two or more phases; a test source line 33 connected to a dummy pixel electrode 12Ds, which is arranged in source lines S not adjacent to each other among a plurality of source lines S, to divide the source lines S into two or more phases; and a test common electrode line 35 connecting the test gate line 32, the test source line 33, and the test switch line 31 mutually.


Inventors:
MAEDA AKITOSHI
Application Number:
JP2009090073A
Publication Date:
October 28, 2010
Filing Date:
April 02, 2009
Export Citation:
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Assignee:
SEIKO EPSON CORP
International Classes:
G09G3/36; G01R31/00; G02F1/13; G02F1/133; G02F1/1368; G09F9/00; G09F9/30; G09G3/20
Domestic Patent References:
JP2005122209A2005-05-12
JP2004219706A2004-08-05
Attorney, Agent or Firm:
Intellectual Property Office