Title:
DURABILITY TEST METHOD FOR ELECTRICAL CONNECTIONS OF SOLAR CELL MODULES
Document Type and Number:
Japanese Patent JP2021065060
Kind Code:
A
Abstract:
To provide a durability test method for electrical connection of solar cell modules that reduce test time.SOLUTION: In a durability test method for electrical connection of solar cell modules, which tests the durability of an electrical connection portion 12 of a plurality of solar cells 1 in a solar cell module, a constituent unit 10 which is one of the constituent units in the solar cell module and in which the solar cell 1 and a wiring member 2 are connected via the electrical connection portion 12 is prepared, and after tensile stress of a predetermined magnitude has been applied to the constituent unit 10 a predetermined number of repetitions, the durability of the electrical connection portion 12 is inspected on the basis of an increase in the electrical resistance of the electrical connection portion 12 in the constituent unit 10 or the presence or absence of peeling of the electrical connection portion 12 in the constituent unit 10.SELECTED DRAWING: Figure 2A
More Like This:
Inventors:
KADOTA NAOKI
Application Number:
JP2019189694A
Publication Date:
April 22, 2021
Filing Date:
October 16, 2019
Export Citation:
Assignee:
KANEKA CORP
International Classes:
H02S50/10; G01N3/34
Attorney, Agent or Firm:
Yuichi Niiyama
Ryota Kato
Ryota Kato