Title:
EGG SURFACE INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2017146174
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an egg surface inspection device capable of detecting relatively large loss and deformation of an outline of an egg shell, such as that of an egg with a relatively large crack, without requiring complicated processing such as that of a conventional crack inspection device that uses captured images.SOLUTION: A surface inspection device 1 is configured to inspect surfaces of eggs E while conveying the eggs positioned such that major axes thereof lie horizontally in a direction perpendicular to a conveying direction, and comprises; conveyance means 2 configured to convey the eggs E while rotating the eggs E about the major axes thereof; light projection means 3 configured to emit linear light that extends in a direction perpendicular to the conveying direction A of the conveyance means 2; image capturing means 4 configured to capture images of the eggs E irradiated with the linear light from the light projection means 3; and determination means 5 configured to determine conditions of surfaces of the eggs E based on images of the linear light captured by the image capturing means 4.SELECTED DRAWING: Figure 3
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Inventors:
KIYOTA AKIO
Application Number:
JP2016027563A
Publication Date:
August 24, 2017
Filing Date:
February 17, 2016
Export Citation:
Assignee:
NABERU:KK
International Classes:
G01N21/85; B07C5/342; B65G13/071; B65G39/02; G01B11/24