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Title:
MAGNETIC FLAW DETECTING METHOD AND MAGNETIC FLAW DETECTING DEVICE
Document Type and Number:
Japanese Patent JP2009276232
Kind Code:
A
Abstract:

To provide a magnetic flaw detecting method and magnetic flaw detecting device for highly accurately detecting flaws on a material to be inspected extending in various directions, using a rotating magnetic field.

The magnetic flaw detecting device 100 includes a magnetization means 1 for acting a rotating magnetic field to the object to be inspected, a detection means 2 for detecting a flaw-detection signal, and a signal processing means 3 for providing signal processing to a flaw-detection signal. The magnetization means energizes an alternating current superposing a first current and a second current with a lower frequency than that of the first current as an excitation current. The signal processing means includes a first synchronous detection means 31 for synchronously detecting the flaw-detection signal by regarding the first current as a reference current, a second synchronous detection means 32 for synchronously detecting the output signal of the first synchronous detection means by regarding the second current as a reference signal, and extracting a flaw-candidate signal, and a flaw-image displaying means 34 for displaying a flaw-detection image, in which each pixel has concentration responding to intensity of the flaw-candidate signal in each part of the material to be inspected and a phase of the flaw detection signal in each part is recognized.


Inventors:
SUZUMA TOSHIYUKI
IMANISHI KENJI
Application Number:
JP2008128523A
Publication Date:
November 26, 2009
Filing Date:
May 15, 2008
Export Citation:
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Assignee:
SUMITOMO METAL IND
International Classes:
G01N27/90
Domestic Patent References:
JPS62145162A1987-06-29
JPH0266446A1990-03-06
JP2005164516A2005-06-23
Attorney, Agent or Firm:
Minoru Ohnaka